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Electron microscope - メーカー・企業37社の製品一覧とランキング

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Electron microscopeのメーカー・企業ランキング

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  1. ロンビック Mie//Resin/Plastic
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  4. アイテス Shiga//Electronic Components and Semiconductors
  5. 5 ジャスコインタナショナル 第二事業部 Tokyo//others
企業ランキングへ

Electron microscopeの製品ランキング

更新日： 集計期間:Sep 17, 2025～Oct 14, 2025
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  1. Examples of observing plastics and resin materials using TEM and SEM. ロンビック
  2. Tabletop Scanning Electron Microscope 'Phenom Pharos' ジャスコインタナショナル 第二事業部
  3. [Analysis Case] Morphological Observation and Component Analysis of Solid Polymer Fuel Cell Catalyst Materials 一般財団法人材料科学技術振興財団　MST
  4. 4 Observation of Cellulose Nanofibers (CNF) - Examples of SEM and TEM Observations ロンビック
  5. 5 Research on polymer materials, foreign substance analysis and quality control in pharmaceuticals, electronics, and chemical fields! アズサイエンス 松本本社

Electron microscopeの製品一覧

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Tabletop Scanning Electron Microscope 'Phenom Pharos'

Tabletop Scanning Electron Microscope 'Phenom Pharos'

Even more beautiful with the FE electron gun! Achieving high resolution close to floor models with a tabletop SEM.

We would like to introduce the tabletop scanning electron microscope 'Phenom Pharos' that we handle. It enables analysis at the nano to sub-micron level. Anyone can easily and quickly perform high-resolution observations. Additionally, it is also possible to measure 3D structures, particles, and pores. Please feel free to contact us if you have any requests. 【Features】 ■ Equipped with FE electron gun ■ Easy and speedy high-resolution observation for anyone ■ Observation + α (3D, particles, pores, fibers) *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes

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Dislocation observation using the SEM-ECCI method

Dislocation observation using the SEM-ECCI method

The observation of dislocations in metallic materials has traditionally been done using TEM, but it has now become possible to observe dislocations using SEM.

An essential understanding of the processes of deformation and fracture in metallic materials requires the visualization of dislocation states. Traditionally, transmission electron microscopy (TEM) has been used to observe dislocations in metallic materials, but in recent years, observations using scanning electron microscopy (SEM) have also been attempted. This time, our company has also become capable of observing dislocations using SEM.

  • Contract Analysis

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Observation of dislocations in GaN using the SEM-ECCI method.

Observation of dislocations in GaN using the SEM-ECCI method.

Using the SEM-ECCI method, observation becomes possible with easy preprocessing! We will also introduce measurement examples of single crystal GaN.

Our company conducts dislocation observation of GaN using the SEM-ECCI method. In power semiconductors such as Gallium Nitride (GaN), dislocations present during manufacturing are considered factors that lead to decreased device performance and shortened lifespan. Dislocation observation in semiconductors is mainly performed using Transmission Electron Microscopy (TEM) or the Etch Pit method; however, using the SEM-ECCI method allows for observation with easy pre-treatment. [Measurement Example] - Sample: Single crystal GaN (wafer with GaN deposited on a sapphire substrate) - Surface Orientation: C-plane (0001) ±0.5° - GaN Film Thickness: 4.5 ± 0.5 μm - Measurement Conditions: Backscattering mode *For more details, please refer to the related links or feel free to contact us.

  • Contract measurement

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Observation of GaN defects using forward scattering electrons in SEM.

Observation of GaN defects using forward scattering electrons in SEM.

Dislocations and steps (tiny steps) as well as small orientation differences in power semiconductors such as GaN can be observed.

In power semiconductors such as GaN, atomic-level defects affect performance degradation. By evaluating forward-scattered electrons using an EBSD detector, it becomes possible to observe dislocations as well as steps (small height differences) and micro-orientation differences.

  • Contract Analysis

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"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

By investigating the true cause of the troubles that occurred with the equipment, it becomes possible to formulate effective countermeasures!

By analyzing the damaged areas caused by equipment troubles in detail, we can investigate the true causes of the issues that occurred and propose measures to help prevent recurrence and improve the situation. Utilizing over 40 years of experience and expertise within the Toray Group, we answer our customers' questions using various tools such as electron microscopes and component analysis devices. 【Examples of Analysis Equipment】 ■ Scanning Electron Microscope (SEM) ■ Energy Dispersive X-ray Spectroscopy (EDS) ■ Hardness Tester ■ Various Optical Microscopes, etc.

  • others

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For the pharmaceutical industry! 'Virus safety testing' using electron microscopy.

For the pharmaceutical industry! 'Virus safety testing' using electron microscopy.

Safety testing using transmission electron microscopy! We have years of accumulated experience and achievements!

At the Flower Market Electron Microscopy Technology Research Institute, we offer contract services for "Virus Safety Testing" using electron microscopy. Under strict management in compliance with GLP/GMP, we conduct virus safety tests. For example, when producing biopharmaceuticals using CHO cells, it is necessary to perform electron microscopy observations in the retrovirus negative test based on the test items outlined in ICH Q5A and Q5D. Based on our years of accumulated experience and achievements, we provide our customers with highly reliable data. 【Features】 ■ Safety testing using transmission electron microscopy ■ Years of accumulated experience and achievements ■ Providing customers with highly reliable data *For more details, please refer to the PDF materials or feel free to contact us.

  • Contract Analysis

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[Case Analysis] Pathogenic Escherichia coli O-157

[Case Analysis] Pathogenic Escherichia coli O-157

Analyzing a bacterium known as one of the causes of collective food poisoning using ×30,000 magnification with 1: TEM and 2: SEM!

We would like to introduce a case study of the analysis of "pathogenic Escherichia coli O-157" conducted by our company. "O-157" has recently become known as one of the bacteria responsible for foodborne outbreaks, and elucidating the mechanism of its verotoxin production is an urgent task. Bacteria have a cell wall surrounding them, making it difficult for chemicals such as fixatives to penetrate. The sample preparation method is fundamentally similar to that of animal tissues, but the image quality can be improved by extending the processing time and performing fixation at room temperature. 【Analysis Overview】 ■ Target of Analysis: Pathogenic Escherichia coli O-157 ■ Sample Preparation Method: Essentially similar to animal tissues - Image quality is improved by extending processing time and performing fixation at room temperature. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis

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Tabletop Low Voltage Transmission Electron Microscope (TEM) LVEM 5

Tabletop Low Voltage Transmission Electron Microscope (TEM) LVEM 5

The LVEM 5 is an unprecedented "tabletop type" "low-cost" "transmission electron microscope (TEM)." SEM/STEM can be added as an option.

**Main Features of LVEM5** ◆ Versatility with the ability to switch between TEM (including electron diffraction), SEM, and STEM imaging modes in a single unit. It allows observation of the same area of the sample simply by switching modes (when each imaging mode is equipped). ◆ Outstanding space-saving design; being a tabletop type, it does not require special facilities. ◆ Low voltage (5KV) reduces damage to samples during biological material observation and allows for observation without staining, making it effective for observing light elements and light metals. ◆ Easy operation makes it accessible to anyone, eliminating the need for dedicated operators. ◆ The uniquely designed permanent magnet lens does not require cooling. ◆ The use of an ion getter pump achieves a clean, vibration-free environment and high vacuum. ◆ Easily switchable imaging modes Multiple imaging modes can be executed by switching, allowing for the capture of both surface images and transmission images. Additionally, modes can be switched with one click without needing to readjust the column or the sample.

  • Electron microscope

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Observation of micro-nano domain morphology using High-Resolution Transmission Electron Microscopy (HR-TEM)

Observation of micro-nano domain morphology using High-Resolution Transmission Electron Microscopy (HR-TEM)

We provide contract analysis services equipped with devices for physical analysis, and we also offer on-site analysis.

The main equipment includes "HR-TEM," "Q-pole type SIMS," "μESCA," and "RAMAN." We have accumulated know-how in micro and nano-level surface analysis, allowing us to provide reliable data in a short period. We also offer advice on the analysis of unknown samples. 【Observation of Micro Areas - High-Resolution Transmission Electron Microscopy (HR-TEM)】 ○ A method that irradiates a thinly processed sample with a high-speed electron beam, providing magnified images and information on crystal structures through the imaging of transmitted and scattered electrons. ○ It is suitable for evaluating the structure and crystallinity of thin films. High-resolution observation enables the examination of crystal structures. ● For more details, please download the catalog or contact us.

  • Food Testing/Analysis/Measuring Equipment

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Analysis of electronic components and materials using TEM.

Analysis of electronic components and materials using TEM.

TEM (Transmission Electron Microscope) meets a wide range of requirements for observing failure sites of electronic components, length measurements, elemental analysis, crystal structure analysis, and material evaluation.

TEM can perform not only high-magnification observation but also elemental analysis using EDS and EELS, as well as analysis of crystal structure, surface orientation, lattice constants, and more through electron diffraction.

  • Contract Analysis
  • Other semiconductors
  • Other contract services

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Crystal analysis by EBSD BGA

Crystal analysis by EBSD BGA

The EBSD method allows for the estimation of crystal states and residual stresses! Here is an example of BGA analysis.

Here is an example of the analysis of BGA (Ball Grid Array). In the observation using a microscope, both optical microscopy and SEM are employed. In the crystal analysis using the EBSD method, we utilize the Phase map, Sn Grain map, Sn IPF map, and Sn GROD map, which allow for the inference of crystal states and residual stresses. 【Overview】 ■ Crystal analysis using the EBSD method - Phase map - Sn Grain map - Sn IPF map - Sn GROD map *For more details, please refer to the PDF materials or feel free to contact us.

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  • Analytical Equipment and Devices
  • Analysis Services

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Observation of the diffusion layer of SiC MOSFET using LV-SEM and EBIC methods.

Observation of the diffusion layer of SiC MOSFET using LV-SEM and EBIC methods.

Even with SiC power devices, we can provide consistent support for cross-section preparation of specific areas, observation of diffusion layer shapes, as well as wiring structure and crystal structure analysis!

Our company conducts observations of the diffusion layer of SiC MOSFETs using LV-SEM and EBIC methods. We can perform cross-section fabrication of specific areas using FIB, shape observation of the diffusion layer using LV-SEM/EBIC, and further through analyses of wiring structures and crystal structures using TEM, all applicable to SiC power devices. In "LV-SEM diffusion layer observation," secondary electrons (SE2) influenced by the built-in potential of the PN junction are detected with the Inlens detector. The shape of the diffusion layer can be visualized through SEM observation of the FIB cross-section. [Analysis methods using EBIC] ■ PEM/OBIRCH defect location identification ■ FIB cross-section processing ■ Low acceleration SEM ■ EBIC analysis ■ TEM *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis

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Crack observation using a tabletop SEM (scanning electron microscope).

Crack observation using a tabletop SEM (scanning electron microscope).

Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.

Introducing "Crack Observation Using Tabletop SEM (Scanning Electron Microscope)." In the evaluation of product reliability, cross-sectional observation of cracks is essential. While optical microscopy may overlook small cracks, SEM observation allows for clear identification. Moreover, with a tabletop SEM, no conductive treatment is necessary, enabling quick and detailed observation. 【Features】 ■ No need for deposition ■ Easy visibility of crystal grains ■ Fine cracks are easily visible *For more details, please refer to the PDF document or feel free to contact us.

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  • Electron microscope
  • Contract Analysis
  • Contract Inspection

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[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope)

[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope)

We have published cross-sectional observations in clear vision mode and normal/standard mode!

This document introduces the cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope). Samples with magnetic properties, such as neodymium magnets, cannot be observed in a magnetized state using SEM; however, by applying demagnetization treatment, SEM observation and elemental analysis can be performed. Please take a moment to read it. 【Contents】 ■ Demagnetization of neodymium magnets and cross-sectional observation using SEM (Hitachi High-Tech TM3030Plus) - Demagnetization treatment (SEM observation of the magnet in a magnetized state is not possible, so demagnetization is performed) - Cross-sectional observation - Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.

  • Electron microscope
  • Contract Analysis
  • Contract Inspection

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